Analytical Systems

Product Groups

Together with our solution partners that we represent in the region, we offer comprehensive analysis solutions in chemical, petrochemical, food, pharmaceutical and life science application areas

High Performance Chromatography Systems (HPLC/LCMS)
Gas Chromatography Systems (GC/GCMS)
ICP Spectrometers (ICP-OES / ICP-MS)
Dissolution and Physical Test Systems
Spectrophotometers (UV-VIS / IR / AA / RF)
Thermal Analysis Systems (DSC / DTG / TGA / TMA)
TOF-MS Systems (Q-TOF / MALDI-TOF / IT-TOF)
X-Ray and Optical Emission (EDX/XRF/XRD/PDA)
Surface Analyzers (SPM / AFM / XPS)

Analytical Systems

EDX-7000/8000/8100 Energy Dispersive X-Ray Fluorescence Spectrometer (RoHS)

RoHS and REACH Analyzes

The EDX-7000/8000 models offer excellent sensitivity and high resolution using the latest Silicon Drift Detector (SDD) technology. These devices provide a wide range of applications, from general screening analyses to advanced material research, delivering high performance across various research and industrial fields. The EDX-7000 can analyze elements ranging from Na to U, while the EDX-8000 covers elements from C to U (at ppm-% levels).

Both models feature primary filters that offer high sensitivity for analyses with low detection limits, while the sample observation camera ensures precise sample positioning. The large sample chamber allows for the analysis of various sample types, including solids, thin films, powders, liquids, emulsions, and sludge.

Applications
– Electrical and Electronics (RoHS/ELV Analysis)
– Pharmaceutical and Clinical Research
– Forensics
– Ceramics, Metals, Mining
– Machinery and Automotive
– Petrochemical and Chemical Industries
– Environmental Analysis

Technical Specifications
When combined with a collimator structure and five primary filters, the EDX-7000/8000 offers unparalleled sensitivity and energy resolution. The state-of-the-art SDD detector enables fast and highly sensitive analyses, and since the detector is electronically cooled, there is no need for liquid nitrogen. For the analysis of light elements at low detection limits, a vacuum or helium purge unit can be optionally provided. Additionally, a 12-position turret option is available for automatic sample analyses.

Key Features
– Large sample chamber
– High sensitivity with low detection limits (ppm-%)
– High-speed analysis with automatic measurement time reduction function
– High resolution
– Operation without the need for liquid nitrogen
– Ultra-light element analysis (C-U) with EDX-8000
– Standard sample observation camera and collimator
– Optional vacuum measurement unit and helium purge unit
– Optional 12-position automatic sampler